The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Nov. 18, 2014
Applicant:
Raytheon Company, Waltham, MA (US);
Inventor:
John F. Silny, Playa Vista, CA (US);
Assignee:
RAYTHEON COMPANY, Waltham, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01); G01J 3/04 (2006.01); G01J 3/08 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/027 (2013.01); G01J 3/0208 (2013.01); G01J 3/0232 (2013.01); G01J 3/04 (2013.01); G01J 3/08 (2013.01); G01J 3/18 (2013.01);
Abstract
A multi-mode imaging spectrometer that incorporates two orthogonally positioned entrance slits and is configurable between a first mode in which the system produces images of relatively wide spatial coverage with moderate spectral resolution, using a first one of the two slits, and a second mode in which the system produces images of a smaller spatial area with fine spectral resolution, using the other one of the two slits.