The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

May. 15, 2014
Applicants:

Michael D. Bulatowicz, Canoga Park, CA (US);

Michael S. Larsen, Woodland Hills, CA (US);

Inventors:

Michael D. Bulatowicz, Canoga Park, CA (US);

Michael S. Larsen, Woodland Hills, CA (US);

Assignee:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/62 (2006.01); G01R 33/26 (2006.01);
U.S. Cl.
CPC ...
G01C 19/62 (2013.01); G01R 33/26 (2013.01);
Abstract

One embodiment includes an atomic sensor system. The system includes a vapor cell that is sealed to enclose an alkali metal that is spin-polarized by an optical beam. The vapor cell includes a mirror at a distal end. The system also includes an optical system including a photodetector system and a laser that generates the optical beam. The optical beam is provided into a proximal end of the vapor cell and is reflected back to the photodetector system via the mirror as a reflected optical beam to generate at least one intensity signal. The optical system further includes a control system that modulates a wavelength of the optical beam between an on-resonance wavelength and an off-resonance wavelength with respect to the alkali metal. The system also includes a processor that calculates a measurable parameter associated with the atomic sensor system based on the at least one intensity signal.


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