The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Apr. 16, 2013
Applicant:

Renishaw Plc, Wotton-under-Edge, Gloucestershire, GB;

Inventors:

David Roberts McMurtry, Stancombe, GB;

John Ould, Backwell Farleigh, GB;

Tim Prestidge, Colerne, GB;

Iain Ainsworth, Bristol, GB;

Assignee:

RENISHAW PLC, Wotton-under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/04 (2006.01); G01B 5/008 (2006.01); G01B 7/008 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G01B 21/04 (2013.01); G01B 5/008 (2013.01); G01B 7/008 (2013.01); G01B 21/045 (2013.01); G05B 19/401 (2013.01);
Abstract

A method of building up a measurement data set for a surface of an object using an analog measurement probe mounted on a machine tool apparatus which obtains scanned measurement data of the surface over a plurality of offset traverses. Subsequent traverses are offset from previous traverses such that over a series of traverses the analog probe's surface detecting region progresses i) laterally across the object, and/or ii) away from or towards the object. The course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse.


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