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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9723784 B1

PDFFull Text
Date of Patent:
Aug. 08, 2017

Filed:

Sep. 14, 2015

Crop quality sensor based on specular reflectance

Applicant:

Appareo Systems, Llc, Fargo, ND (US);

Inventors:

Marshall T. Bremer, Fargo, ND (US);

Nicholas L. Butts, West Fargo, ND (US);

Assignee:

Appareo Systems, LLC, Fargo, ND (US);

Attorneys:

Law Office of Mark Brown, LLC

Mark E. Brown

Primary Examiner:

Jonathan S Lee

Int. Cl.
CPC ...
G06K 9/00 (2006.01); A01D 41/127 (2006.01); G01G 19/08 (2006.01); A01D 57/12 (2006.01); G01B 7/14 (2006.01); G01N 33/00 (2006.01); G01S 13/86 (2006.01); G01S 13/87 (2006.01); G01S 17/02 (2006.01); G01S 17/88 (2006.01); H04N 5/225 (2006.01); G06T 7/00 (2017.01); B65G 43/08 (2006.01); G01L 1/00 (2006.01); G01S 17/89 (2006.01); G01S 7/41 (2006.01); G01S 13/88 (2006.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
A01D 41/127 (2013.01); A01D 41/1277 (2013.01); A01D 57/12 (2013.01); B65G 43/08 (2013.01); G01B 7/14 (2013.01); G01G 19/08 (2013.01); G01L 1/00 (2013.01); G01N 33/0098 (2013.01); G01S 7/411 (2013.01); G01S 13/865 (2013.01); G01S 13/867 (2013.01); G01S 13/87 (2013.01); G01S 13/88 (2013.01); G01S 17/026 (2013.01); G01S 17/88 (2013.01); G01S 17/89 (2013.01); G06K 9/00791 (2013.01); G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); H04N 5/2256 (2013.01); A01D 41/1271 (2013.01); A01D 41/1272 (2013.01); A01D 41/1273 (2013.01); A01D 41/1274 (2013.01); A01D 41/1276 (2013.01); G06K 2209/17 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30128 (2013.01); H04N 5/23229 (2013.01);
Abstract

A crop quality sensor, comprising an illumination source, an imaging device, and a processor executing application software. The illumination source is shone onto a crop sample, and an image is taken with the imaging device of the illuminated crop sample. The software executing on the processor is used to analyze the image to identify the outlines of individual kernels and to identify which of those outlines contain a specular highlight, indicative that the kernel is whole and unbroken, while the absence of such a specular highlight is indicative of a broken kernel.

Find Patent Forward Citations

Quick Actions:

Bremer, Marshall. (2017). Crop quality sensor based on specular reflectance (U.S. Patent No. 9723784). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9723784

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