The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Mar. 31, 2015
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Pingshan Li, Sunnyvale, CA (US);
Xue Tu, Fremont, CA (US);
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06T 7/00 (2017.01); G06T 7/571 (2017.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G06T 7/571 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/20024 (2013.01);
Abstract
A blur estimation method and apparatus which utilizes Gaussian differences at multiple resolutions, upon which iterative convolution is performed to match sharpness measures between two images. Blur differences are combined with an iteration number selected from multiple resolution levels based on comparing a sharpness ratio as the blur difference estimate. Blur difference estimate is then applied through a depth model to arrive at a depth estimate. Blur difference depth estimation can be utilized for controlling operation of focus control hardware in an imaging device.