The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Apr. 18, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rohith K. Ashok, Natick, MA (US);

Erik J. Burckart, Raleigh, NC (US);

Aaron J. Quirk, Cary, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01); H04L 12/927 (2013.01); H04L 12/851 (2013.01); H04L 12/911 (2013.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0817 (2013.01); H04L 41/5025 (2013.01); H04L 41/5035 (2013.01); H04L 47/2425 (2013.01); H04L 47/72 (2013.01); H04L 47/805 (2013.01); H04L 41/5096 (2013.01);
Abstract

In an approach to manage isolation requirements of a multi-node workload application, a computer determines one or more first isolation levels for each of a plurality of workload nodes. The computer receives performance data for the plurality of workload nodes and analyzes the performance data for statistical trends in the performance data. The computer identifies an adverse trend in the statistical trends of the performance data and identifies a root cause of the adverse trend in the performance data. The computer then identifies one or more second isolation levels required to meet performance targets, the second isolation levels including an adjustment to the first isolation levels for the plurality of workload nodes.


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