The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Jul. 23, 2015
Nec Laboratories America, Inc., Princeton, NJ (US);
Nec Corporation, Tokyo, JP;
Fatih Yaman, Monmouth Junction, NJ (US);
Shaoliang Zhang, Princeton, NJ (US);
Ting Wang, West Windsor, NJ (US);
Yoshihisa Inada, Tokyo, JP;
Takaaki Ogata, Tokyo, JP;
NEC Corporation, , JP;
Abstract
A wavelength division multiplexing system and method featuring a wavelength monitor that is configured to receive a portion of a combined signal of wavelength division multiplexing channels and determine the wavelengths of each channel or the guardband between each channel in the combined signal. The wavelength monitor determines if there is excess laser drift for each channel in the combined signal. If excess laser drift is determined, feedback is sent to the transmitter for the signal with excess laser drift and the signal is adjusted to produce a target wavelength. The wavelength monitor may utilize optical intradyning in order to monitor the wavelengths of each channel in the combined signal.