The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Apr. 15, 2015
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Yoshitaka Otsubo, Tokyo, JP;

Takuya Takahashi, Tokyo, JP;

Masaomi Miyazawa, Tokyo, JP;

Tetsuo Yamashita, Tokyo, JP;

Tomohiro Hieda, Tokyo, JP;

Mituharu Tabata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 7/20 (2006.01); H01L 23/24 (2006.01); H01L 23/36 (2006.01); H01L 23/373 (2006.01); H01L 23/498 (2006.01); H01L 23/057 (2006.01); H01L 23/473 (2006.01);
U.S. Cl.
CPC ...
H01L 23/24 (2013.01); H01L 23/057 (2013.01); H01L 23/36 (2013.01); H01L 23/3735 (2013.01); H01L 23/49811 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/49113 (2013.01); H01L 2224/73265 (2013.01); H01L 2924/181 (2013.01); H01L 2924/19107 (2013.01);
Abstract

A semiconductor device includes a semiconductor element and a ceramic circuit substrate on which the semiconductor element is mounted. The ceramic circuit substrate includes a ceramic substrate having one surface and the other surface facing each other, a metal circuit board joined to the one surface of the ceramic substrate and electrically connected to the semiconductor element, and a metal heat-dissipation plate joined to the other surface of the ceramic substrate. The metal circuit board is greater in thickness than the metal heat-dissipation plate. A surface of the metal heat-dissipation plate on a side opposite to the ceramic substrate is larger in area than a surface of the metal circuit board on a side opposite to the ceramic substrate. Thereby, a semiconductor device capable of suppressing warpage of the ceramic substrate can be achieved.


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