The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Nov. 18, 2015
Applicant:

Taiyo Yuden Co., Ltd., Taito-ku, Tokyo, JP;

Inventors:

Chie Kawamura, Takasaki, JP;

Tetsuo Shimura, Takasaki, JP;

Minoru Ryu, Takasaki, JP;

Koichiro Morita, Takasaki, JP;

Yukihiro Konishi, Takasaki, JP;

Yoshiki Iwazaki, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C04B 35/468 (2006.01); H01G 4/12 (2006.01); H01G 4/30 (2006.01); H01G 4/012 (2006.01);
U.S. Cl.
CPC ...
H01G 4/1227 (2013.01); C04B 35/4682 (2013.01); H01G 4/012 (2013.01); H01G 4/30 (2013.01); C04B 2235/3224 (2013.01); C04B 2235/3239 (2013.01); C04B 2235/3251 (2013.01); C04B 2235/3256 (2013.01); C04B 2235/3258 (2013.01); C04B 2235/3418 (2013.01); C04B 2235/5409 (2013.01); C04B 2235/5445 (2013.01); C04B 2235/5454 (2013.01); C04B 2235/6025 (2013.01); C04B 2235/785 (2013.01); H01G 4/12 (2013.01);
Abstract

A multilayer ceramic capacitor has a laminate including dielectric layers laminated alternately with internal electrode layers of different polarities, wherein the dielectric layer contains ceramic grains having Ba, Ti, and X (wherein X represents at least one type of element selected from the group consisting of Mo, Ta, Nb, and W) and a variation in the concentration distribution of X above in the ceramic grain is within ±5%. The multilayer ceramic capacitor can offer excellent service life characteristics even when the thickness of the dielectric layer is 0.8 μm or less, as well as excellent bias characteristics.


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