The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Jan. 04, 2013
Applicant:

Kemira Oyj, Helsinki, FI;

Inventors:

Jukka-Pekka Raunio, Tampere, FI;

Mikko Makinen, Espoo, FI;

Henry Skoog, Roswell, GA (US);

Assignee:

KEMIRA OYJ, Helsinki, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/04 (2011.01); G01B 11/30 (2006.01); G01B 11/24 (2006.01); G01N 33/34 (2006.01); G06T 7/42 (2017.01);
U.S. Cl.
CPC ...
G06T 15/04 (2013.01); G01B 11/24 (2013.01); G01B 11/303 (2013.01); G01N 33/346 (2013.01); G06T 7/42 (2017.01); G06T 2200/04 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30124 (2013.01); G06T 2215/12 (2013.01);
Abstract

Methods of characterizing the topography of a surface of a creped material, devices for characterizing surface topography of a creped material, computer systems for characterizing surface topography of a creped material, and the like, are disclosed.


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