The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Mar. 27, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Inventors:
Derek J. Lentz, Sun Valley, NV (US);
Sang Oak Woo, Gyeonggi-do, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 15/80 (2011.01); G06T 15/40 (2011.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06T 15/005 (2013.01); G06F 9/44 (2013.01); G06T 15/40 (2013.01);
Abstract
Fragment merging is performed on a draw call basis. One application is for quad merging. Primitives of the same draw call have many common attributes, such as a graphics state, which facilitates merging of quad fragments. Partially covered quad fragments of the same draw call are considered for possible merging and at least one merge test performed. The merge test may include error tests such as a level of detail error test, interpolated depth, and an interpolation error test.