The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Jan. 09, 2012
Applicants:
Anant Madabhushi, South Plainfield, NJ (US);
Shannon C. Agner, Highland Park, NJ (US);
Inventors:
Anant Madabhushi, South Plainfield, NJ (US);
Shannon C. Agner, Highland Park, NJ (US);
Assignee:
RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY, New Brunswick, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 7/32 (2017.01); G06T 7/11 (2017.01); G06T 7/149 (2017.01); G06T 7/174 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 7/149 (2017.01); G06T 7/174 (2017.01); G06T 7/32 (2017.01); G06T 2207/10096 (2013.01); G06T 2207/20116 (2013.01);
Abstract
The described invention provides systems and methods for detecting and segmenting a lesion from longitudinal, time series, or multi-parametric imaging by utilizing spectral embedding-based active contour (SEAC). In addition, the described invention further provides systems and methods for registering time series data by utilizing reduced-dimension eigenvectors derived from spectral embedding (SE) of feature scenes (SERg).