The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Dec. 03, 2015
International Business Machines Corporation, Armonk, NY (US);
Boliang Chen, Shanghai, CN;
Min Gong, Shanghai, CN;
Dong Sheng Li, Shanghai, CN;
Junchi Yan, Shanghai, CN;
Chao Zhang, Beijing, CN;
Wei Peng Zhang, Shanghai, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method, computer program product, and system for detecting work-piece defects. The computer-implemented method may include: receiving a first image of a training work-piece captured using a non-destructive imaging process and a second image of the training work-piece captured using a destructive imaging process; receiving an image of a work-piece captured using a non-destructive imaging process, wherein the work-piece is substantially similar to the training work-piece, and the non-destructive imaging process used to capture the work-piece is substantially similar to the non-destructive imaging process used to capture the training work-piece; matching the image of the work-piece to the first image of the training work-piece; and enhancing the image of the work-piece using the second image of the training work-piece, in response to the image of the work-piece matching the first image of the training work-piece.