The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Oct. 28, 2013
Qualcomm Incorporated, San Diego, CA (US);
Michael Campos, La Jolla, CA (US);
Casimir Matthew Wierzynski, San Diego, CA (US);
Bardia Fallah Behabadi, Pasadena, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
An artificial neural network may be configured to test the impact of certain input parameters. To improve testing efficiency and to avoid test runs that may not alter system performance, the effect of input parameters on neurons or groups of neurons may be determined to classify the neurons into groups based on the impact of certain parameters on those groups. Groups may be ordered serially and/or in parallel based on the interconnected nature of the groups and whether the output of neurons in one group may affect the operation of another. Parameters not affecting group performance may be pruned as inputs to that particular group prior to running system tests, thereby conserving processing resources during testing.