The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Jul. 26, 2016
Megachips Corporation, Osaka, JP;
Hiromu Hasegawa, Osaka, JP;
MegaChips Corporation, Osaka, JP;
Abstract
An apparatus and method to detect a line segment or arc using Hough transform. A Hough transform unit performs contour extraction on brightness image data to generate contour image data, with pixels having a pixel value of 0 to 255, performs the Hough transform on points in the contour image data, and counts additional values represented by pixel values of points in the contour image data in a Hough table. The Hough transform unit performs contour extraction on first to third component data to generate first to third contour data with pixels having a pixel value of 0 to 255, performs the Hough transform on points in the first to third contour data, and counts additional values represented by pixel values of points in the first to third contour data in the Hough table. The detection unit comprehensively evaluates the counts to detect a line segment or arc.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile