The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
May. 22, 2015
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Dragos D. Boia, Seattle, WA (US);
Viresh Ramdatmisier, Seattle, WA (US);
Jiong Qiu, Sammamish, WA (US);
Barry Markey, Kirkland, WA (US);
Alisson A. S. Sol, Bellevue, WA (US);
Donald J. Ankney, Seattle, WA (US);
Eugene V. Bobukh, Kirkland, WA (US);
Robert D. Fish, Seattle, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Template identification techniques for control of testing are described. In one or more implementations, a method is described to control testing of one or more services by one or more computing devices using inferred template identification. Templates are inferred, by the one or more computing devices, that are likely used for documents for respective services of a service provider that are available via corresponding universal resource locators (URLs) to form an inferred dataset. Overlaps are identified by the one or computing devices in the inferred dataset to cluster services together that have likely used corresponding templates. Testing is controlled by the one or more computing devices of the one or more services based at least in part on the clusters.