The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Sep. 20, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Olaf K. Hendrickson, Rochester, MN (US);

Yugi Morimoto, Poughkeepsie, NY (US);

Michael P. Mullen, Poughkeepsie, NY (US);

Michal Rimon, Nofit, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3181 (2006.01); G06F 11/22 (2006.01); G06F 11/26 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G01R 31/31813 (2013.01); G06F 11/2242 (2013.01); G06F 11/2236 (2013.01); G06F 11/261 (2013.01);
Abstract

A method and system are provided for implementing functional verification including generating and running constrained random irritator tests for a multiple processor system and for a processor core with multiple threads. Separate tests are generated, a main test for one thread, and an irritator test for each other thread in the configuration. The main test and each irritator test are saved and randomly mixed then combined together again, where the main thread is not forced to be generated with any particular irritator.


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