The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Jul. 22, 2011
Applicants:
Marcus Dyba, Heidelberg, DE;
Jonas Foelling, Heidelberg, DE;
Inventors:
Marcus Dyba, Heidelberg, DE;
Jonas Foelling, Heidelberg, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/253 (2006.01); G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/24 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G02B 21/245 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01); H04N 5/253 (2013.01);
Abstract
A device and a method for acquiring a microscopic image of a sample structure are described. An optic for imaging the sample structure and a reference structure is provided, as well as a drift sensing unit for sensing a drift of the sample structure relative to the optic on the basis of the imaged reference structure. The optic comprises a first sharpness plane for imaging the sample structure and at the same time a second sharpness plane, modifiable in location relative to the first sharpness plane, for imaging the reference structure.