The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Nov. 19, 2015
Nec Laboratories America, Inc., Princeton, NJ (US);
Giovanni Milione, Franklin Square, NY (US);
Neda Cvijetic, Plainsboro, NJ (US);
Ting Wang, West Windsor, NJ (US);
NEC Corporation, Tokyo, JP;
Abstract
A system and method for remote object sensing which features a spatially polarization-inhomogeneous light beam that is directed on the remote object. A polarimetry receiver receives the light beam after it contacts the remote object. The changes in the spatially polarization-inhomogeneous light beam from contacting the remote object are a result of spatial features of the remote object. The polarimetry receiver is configured to measure the spatially inhomogeneous electric field of the light beam after it contacts the remote object and compute the changes in the spatially polarization-inhomogeneous light beam in order to detect spatial features of the remote object. The system obtains high-resolution, real-time information concerning important spatial features of the remote object.