The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9720037 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 01, 2017

Filed:

Mar. 30, 2016
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Toshiyuki Ichiba, Kawasaki, JP;

Yoshinori Tomita, Yokohama, JP;

Yutaka Tamiya, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31705 (2013.01); G01R 31/3177 (2013.01);
Abstract

A circuit includes don't-care a code-value calculation circuit to calculate third code-values by coding a signal sequence in accordance with a coding scheme; a first sequence-detection circuit to detect a first sequence based on comparison of a first code-value with a difference between the current third code-value and a fourth code-value that is the third code-value preceding the current third code-value by a length of the first sequence; an expected-value calculation circuit to calculate an expected value of the third code-value at the end of the third sequence based on a second code-value and a fifth code-value that is one of the third code-values; and a determination circuit to detect the end of the second sequence based on a length of a fourth sequence, notify an expected-value calculation circuit of the detection of the second sequence, and output a detection signal indicating detection of a detection-target sequence.


Find Patent Forward Citations

Ichiba, Toshiyuki. (2017). Debug circuit, semiconductor device, and debug method (U.S. Patent No. 9720037). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9720037

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