The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Sep. 28, 2016
Applicant:

Livewire Innovation, Inc., South Jordan, UT (US);

Inventors:

Lee Arthur Watkins, Thousand Oaks, CA (US);

Niall Michael McNamara, Santa Barbara, CA (US);

Assignee:

LiveWire Innovation, Inc., South Jordan, UT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/11 (2006.01); G01R 31/08 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/11 (2013.01); G01R 31/021 (2013.01); G01R 31/025 (2013.01); G01R 31/083 (2013.01); G01R 31/085 (2013.01);
Abstract

There are disclosed apparatus and methods for testing a live circuit powered from an alternating current (AC) voltage. A live circuit tester includes a spread spectrum time domain reflectometer (SSTDR) configured to perform SSTDR measurements of the live circuit and a memory storing one or more ignore distance values. A processor coupled to the SSTDR and the memory detects a potential fault in the live circuit based on results of one or more SSTDR measurements, the potential fault associated with a distance from the apparatus. The processor compares the distance associated with the potential fault with each of the one or more ignore distance values, and stores, in the memory, data defining the potential fault if the associated distance does not match any of the one or more ignore distance values.


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