The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Jul. 07, 2015
Applicant:
Hitachi High-tech Science Corporation, Minato-ku, Tokyo, JP;
Inventor:
Masahiro Sakuta, Tokyo, JP;
Assignee:
Hitachi High-Tech Science Corporation, Minato-ku, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01N 23/22 (2006.01); G01N 35/00 (2006.01); G01T 7/12 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 23/2204 (2013.01); G01N 35/00693 (2013.01); G01N 35/00732 (2013.01); G01T 7/12 (2013.01); G01N 2035/00702 (2013.01);
Abstract
A sample plate is for X-ray analysis to which a sample is fixed in performing an analysis using an X-ray fluorescent analyzer, and includes: a plate-like body that supports the sample; and a code-indicated portion provided on the plate-like body in which information on the sample is encoded and indicated.