The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Oct. 07, 2016
Applicant:

Xrsciences Llc, Carlsbad, CA (US);

Inventors:

Colin Charette, Encinitas, CA (US);

Tom Atwell, Carlsbad, CA (US);

Jacob Lopp, Fort Worth, TX (US);

Chaur-Ming Shyu, San Diego, CA (US);

Assignee:

XRSCIENCES, LLC, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/222 (2006.01); G01T 3/02 (2006.01); G01N 23/083 (2006.01);
U.S. Cl.
CPC ...
G01N 23/222 (2013.01); G01N 23/083 (2013.01); G01T 3/02 (2013.01); G01N 2223/071 (2013.01); G01N 2223/076 (2013.01); G01N 2223/0745 (2013.01); G01N 2223/635 (2013.01);
Abstract

Systems and Methods for an air slide analyzer for measuring the elemental content of aerated material traveling by air slide. The air slide analyzer has an analyzer having an entrance opening and an exit opening, and an interior tunnel adapted for aerated material conveyed by an air slide; a radiation detector proximal to the analyzer; a neutron source emitting neutrons into material within the analyzer; and a processor to analyze detected information from the radiation detector, wherein emissions from the material being irradiated with neutrons are detected by the radiation detector and analyzed by the processor to provide elemental information of the material in the analyzer.


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