The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Feb. 18, 2015
Applicant:

Sandia Corporation, Albuquerque, NM (US);

Inventors:

Stephen J. Bauer, Albuquerque, NM (US);

Steven F. Glover, Albuquerque, NM (US);

Tom Pfeifle, Albuquerque, NM (US);

Jiann-Cherng Su, Albuquerque, NM (US);

Kenneth Martin Williamson, Albuquerque, NM (US);

Scott Thomas Broome, Santa Fe, NM (US);

William Payton Gardner, Albuquerque, NM (US);

Gary Pena, Albuquerque, NM (US);

Assignee:

Sandia Corporation, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01); G01N 15/08 (2006.01); G01N 1/28 (2006.01); G01N 1/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/082 (2013.01); G01N 1/28 (2013.01); G01N 2001/1062 (2013.01);
Abstract

A device for electrofracturing a material sample and analyzing the material sample is disclosed. The device simulates an in situ electrofracturing environment so as to obtain electrofractured material characteristics representative of field applications while allowing permeability testing of the fractured sample under in situ conditions.


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