The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Aug. 29, 2014
Applicant:

Verizon Patent and Licensing Inc., Arlington, VA (US);

Inventors:

Ashok N. Srivastava, Mountain View, CA (US);

Fu-Kuo Chang, Stanford, CA (US);

Assignee:

VERIZON PATENT AND LICENSING INC., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G21C 17/00 (2006.01); G01M 5/00 (2006.01); G05B 23/02 (2006.01); B61L 23/04 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0033 (2013.01); G05B 23/0283 (2013.01); B61L 23/042 (2013.01); G05B 23/027 (2013.01); G05B 23/0286 (2013.01); G05B 2219/31205 (2013.01); G05B 2219/31434 (2013.01);
Abstract

A device receives information, associated with civil structures, that includes temperature information associated with the civil structures, pressure information associated with the civil structures, stress information associated with the civil structures, vibration information associated with the civil structures, or displacement information associated with the civil structures. The device performs an analysis of the information associated with the civil structures via one or more analytics techniques, and generates analysis information based on the analysis of the information associated with the civil structures. The analysis information identifies a potential issue with at least one of the civil structures, and the device provides the analysis information for display.


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