The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Jan. 21, 2016
Applicant:

Taiyo Yuden Co., Ltd., Tokyo, JP;

Inventors:

Katsuhiro Oyama, Tokyo, JP;

Fuyuki Miyazawa, Tokyo, JP;

Yasuhito Hagiwara, Tokyo, JP;

Takaki Hamamoto, Tokyo, JP;

Isao Matsuda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01); G01D 5/26 (2006.01); G02B 27/42 (2006.01); G01D 5/38 (2006.01);
U.S. Cl.
CPC ...
G01D 5/266 (2013.01); G01D 5/34715 (2013.01); G01D 5/38 (2013.01); G02B 27/4272 (2013.01);
Abstract

An optical unit includes: a first diffraction grating where light from a light source enters; a second diffraction grating that generates interference light as a result of diffracted light rays emitted from the first diffraction grating entering the second diffraction grating; and an optical member including a pair of reflective surfaces that are parallel and opposite to each other, the optical member being configured such that the pair of reflective surfaces respectively reflect ±mth-order diffracted light rays that are diffracted light rays of a specific order among a plurality of orders of the diffracted light rays emitted from the first diffraction grating so as to guide the ±mth-order diffracted light rays to the second diffraction grating, where m is a natural number.


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