The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Nov. 23, 2015
Applicant:

Pacific Biosciences of California, Inc., Menlo Park, CA (US);

Inventors:

Cheng Frank Zhong, Fremont, CA (US);

Paul Lundquist, San Francisco, CA (US);

Mathieu Foquet, Newark, CA (US);

Jonas Korlach, Camas, WA (US);

Hovig Bayandorian, Berkeley, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); G01N 21/64 (2006.01); G01N 21/77 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6874 (2013.01); C12Q 1/68 (2013.01); C12Q 1/6825 (2013.01); G01N 21/648 (2013.01); G01N 21/6428 (2013.01); G01N 21/7703 (2013.01); G01N 33/54373 (2013.01); G01N 2021/6463 (2013.01); G01N 2201/0638 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/08 (2013.01);
Abstract

This invention provides substrates for use in various applications, including single-molecule analytical reactions. Methods for propagating optical energy within a substrate are provided. Devices comprising waveguide substrates and dielectric omnidirectional reflectors are provided. Waveguide substrates with improved uniformity of optical energy intensity across one or more waveguides and enhanced waveguide illumination efficiency within an analytic detection region of the arrays are provided.


Find Patent Forward Citations

Zhong, Cheng. (2017). Substrates and optical systems and methods of use thereof having a single optically resolvable immobilized reaction component disposed within a nanometer-scale aperture (U.S. Patent No. 9719138). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9719138

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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