The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Dec. 02, 2015
Applicant:
3m Innovative Properties Company, St. Paul, MN (US);
Inventors:
Takatoshi Moriyama, Kanagawa, JP;
Patrick A. Mach, Shorewood, MN (US);
Akio Kitahara, Kanagawa, JP;
Henry J. Lubrant, White Bear Lake, MN (US);
Assignee:
3M INNOVATIVE PROPERTIES COMPANY, Saint Paul, MN (US);
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/04 (2006.01); C12Q 1/34 (2006.01); C12Q 1/44 (2006.01); C12Q 1/10 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/04 (2013.01); C12Q 1/10 (2013.01); C12Q 1/34 (2013.01); C12Q 1/44 (2013.01);
Abstract
A method of detecting. The method comprises providing a culture device with a selective culture medium and a detection article comprising a first indicator system. The selective culture medium facilitates the growth ofmicroorganisms. When amicroorganism is detected in a sample contacted with the culture medium, the detection article is contacted with the culture medium to detect