The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Feb. 20, 2015
Applicant:

Tomey Corporation, Nagoya-shi, JP;

Inventors:

Chihiro Kato, Nagoya, JP;

Katsumasa Okouchi, Nagoya, JP;

Assignee:

Tomey Corporation, Nagoya-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/117 (2006.01); A61B 3/14 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/117 (2013.01); A61B 3/0008 (2013.01); A61B 3/0058 (2013.01); A61B 3/1025 (2013.01); A61B 3/14 (2013.01);
Abstract

An ophthalmologic apparatus measures a dimension of an eye to be examined. The ophthalmologic apparatus includes a light source, an incidence member, an acquisition unit, and a display unit. The incidence member causes light from the light source to be incident on a plurality of different positions in the eye to be examined. The acquisition unit acquires a two-dimensional tomographic image of an interior of the eye to be examined on the basis of a plurality of interference signals acquired as a result of the incidence member causing the incidence of light on the plurality of different positions. The display unit displays the acquired two-dimensional tomographic image.


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