The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Jan. 16, 2013
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

Bryan A. Mueller, Frisco, TX (US);

Erik S. Wheeler, Farmers Branch, TX (US);

Mark R. Plagens, Richardson, TX (US);

Urs Mader, Cupertino, CA (US);

Assignee:

Maxim Integrated Products, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 3/02 (2006.01); H04B 1/12 (2006.01); H04B 15/00 (2006.01); H04L 25/49 (2006.01); H01M 10/48 (2006.01); H02J 7/00 (2006.01); H01M 10/42 (2006.01);
U.S. Cl.
CPC ...
H04B 1/123 (2013.01); H04B 15/005 (2013.01); H04L 25/4904 (2013.01); H01M 10/4207 (2013.01); H01M 10/482 (2013.01); H01M 2010/4271 (2013.01); H01M 2220/20 (2013.01); H02J 7/0021 (2013.01); Y02T 10/7055 (2013.01);
Abstract

An integrated standard-compliant data acquisition device includes an electrically insulating package including a plurality of conductive leads and an integrated circuit (IC) disposed within the electrically insulating package and electrically coupled to at least some of the plurality of conductive leads. The IC includes a first multiplexer (MUX), a second MUX, a third MUX, an analog-to-digital converter (ADC), a plurality of registers, a fourth MUX, control logic, and communication circuitry. In operation, a first circuit value under a first condition can be determined and stored, a second circuit value under a second condition can be determined and stored, and the decision as to whether there is a fault condition can be mad by comparing the first circuit value and the second circuit value.


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