The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Dec. 08, 2014
Mamoru Yorimoto, Kanagawa, JP;
Nobuyuki Satoh, Kanagawa, JP;
Masato Kobayashi, Kanagawa, JP;
Masayuki Fujii, Kanagawa, JP;
Hiroshi Matsumoto, Kanagawa, JP;
Daisaku Horikawa, Kanagawa, JP;
Suguru Yokozawa, Kanagawa, JP;
Kenji Morita, Tokyo, JP;
Mamoru Yorimoto, Kanagawa, JP;
Nobuyuki Satoh, Kanagawa, JP;
Masato Kobayashi, Kanagawa, JP;
Masayuki Fujii, Kanagawa, JP;
Hiroshi Matsumoto, Kanagawa, JP;
Daisaku Horikawa, Kanagawa, JP;
Suguru Yokozawa, Kanagawa, JP;
Kenji Morita, Tokyo, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An apparatus includes: a light source; a two-dimensional image sensor that receives reflected light from a subject including specular light of the source and outputs an image of the subject; and an optical member arranged in an optical path of light emitted from the source to the subject. When a specular position of the source in the subject arranged apart from the two-dimensional image sensor by a certain distance is defined as a first specular position, whereas a specular position of the source in the optical member is defined as a second specular position, a relative positional relation of the optical member and the source with respect to the two-dimensional image sensor is determined so that a difference between an incident angle from the source toward the first specular position and an incident angle from the source toward the second specular position is a reference value or more.