The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Sep. 05, 2014
Beijing Institute of Technology, Beijing, CN;
BEIJING INSTITUTE OF TECHNOLOGY, Beijing, CN;
Abstract
A method for analyzing ionic structure, including: applying a radio frequency electric field on an ion mass analyzer to cause sample ions to be excited to a motion amplitude, the motion amplitude at this moment being recorded as a primary motion amplitude; continuously feeding carrier gas into the ion mass analyzer and keeping a certain degree of vacuum in the ion mass analyzer, the sample ions being collided with the carrier gas and the motion amplitude being decreased gradually, and collecting a time domain signal of an image current generated by the sample ions during the process; and analyzing the time domain signal through a time-frequency analysis method and obtaining time-varying characteristic curves indicating corresponding relations between the motion frequencies of the ions having corresponding sizes and the collision cross sectional areas of the ions and the carrier gas, thus distinguishing among ions having different sizes.