The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Aug. 12, 2015
Texas Instruments Incorporated, Dallas, TX (US);
Yuming Zhu, Plano, TX (US);
Manish Goel, Plano, TX (US);
Clive Bittlestone, Lucas, TX (US);
Yunchen Qiu, Plano, TX (US);
Sai Zhang, Urbana, IL (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Data words to be written to a memory location are delta encoded in multi-write avoidance ('MWA') code words. MWA code words result in no re-writing of single-bit storage cells containing logical '0's' to a “0” state and no re-writing of logical “1's” to cells that have already been written once to a logical “1.” Potential MWA code words stored in a look-up table (“LUT”) are indexed by a difference word DELTA_D. DELTA_D represents a bitwise difference (“delta”) between a data word currently stored at the memory location and a new data word (“NEW_D”) to be stored at the memory location. Validation and selection logic chooses an MWA code word representing NEW_D to be written if the MWA code word does not violate the principle of multi-write avoidance. Some embodiments generate the MWA code words using a pattern generator rather than indexing the MWA code words from a LUT.