The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Jul. 07, 2014
Vangogh Imaging, Inc., McLean, VA (US);
Ken Lee, Fairfax, VA (US);
Jun Yin, McLean, VA (US);
Xin Hou, Falls Church, VA (US);
Greg Werth, Washington, DC (US);
Yasmin Jahir, McLean, VA (US);
VanGogh Imaging, Inc., McLean, VA (US);
Abstract
Methods and systems are described for generating a three-dimensional (3D) model of a fully-formed object represented in a noisy or partial scene. An image processing module of a computing device receives images captured by a sensor. The module generates partial 3D mesh models of physical objects in the scene based upon analysis of the images, and determines a location of at least one target object in the scene by comparing the images to one or more 3D reference models and extracting a 3D point cloud of the target object. The module matches the 3D point cloud of the target object to a selected 3D reference model based upon a similarity parameter, and detects one or more features of the target object. The module generates a fully formed 3D model of the target object using partial or noisy 3D points from the scene, extracts the detected features of the target object and features of the 3D reference models that correspond to the detected features, and calculates measurements of the detected features.