The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Oct. 25, 2013
Applicant:

Netvirta, Llc, Belmont, MA (US);

Inventors:

Jian Chen, Belmont, MA (US);

Andy Eow, New York, NY (US);

Xiaoxu Ma, Sunnyvale, CA (US);

Assignee:

Netvirta, LLC, Belmont, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 17/00 (2006.01); G06T 19/00 (2011.01); G06T 7/529 (2017.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G06T 7/529 (2017.01); G06T 19/00 (2013.01); B33Y 50/00 (2014.12); G06T 2210/16 (2013.01);
Abstract

Images are made of a surface, and images are made of a covering (in the form of a reference object) having a pattern that includes an array of locally non-repetitive pattern elements. A three-dimensional models of the pattern elements on the covering is created using the images. A correlation in scaling between the process of generating three-dimensional models of the pattern elements on the covering and the process of generating a three-dimensional model of the surface is known, and this known correlation in scaling and the known actual distances among pattern elements on the covering can be used as a dimensional scale reference to determine dimensional information of the three-dimensional model of the surface.


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