The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Dec. 05, 2013
Applicants:

Sunil Goraksha Patil, Columbia, MD (US);

Di Xu, Baltimore, MD (US);

Inventors:

Sunil Goraksha Patil, Columbia, MD (US);

Di Xu, Baltimore, MD (US);

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G06T 7/00 (2017.01); G01R 33/565 (2006.01); G01R 33/48 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01R 33/4804 (2013.01); G01R 33/56509 (2013.01); G01R 33/56563 (2013.01); G01R 33/5608 (2013.01); G01R 33/5613 (2013.01); G01R 33/5616 (2013.01);
Abstract

A method and apparatus for Bcorrection in echo-planar (EP) based magnetic resonance image (MRI) is disclosed. Two phase images are obtained from each of a first echo-planar imaging (EPI) acquisition and a second EPI acquisition. A first susceptibility map is generated based on the two phase images obtained from the first EPI acquisition and a second susceptibility map is generated based on the two phase images obtained from the second EPI acquisition. A smooth polynomial function for modeling the Bdrift and respiratory motion between the first EPI acquisition and the second EPI acquisition is initialized based on the first and second susceptibility maps. A compensated temperature map is then iteratively reconstructed based on the smooth polynomial function.


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