The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Dec. 18, 2015
Sony Corporation, Tokyo, JP;
Pingshan Li, Sunnyvale, CA (US);
Jianing Wei, Cupertino, CA (US);
Xue Tu, Fremont, CA (US);
Alexander Berestov, San Jose, CA (US);
Takami Mizukura, Kanagawa, JP;
Akira Matsui, Kanagawa, JP;
Tomonori Shuda, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
Focus detection is to determine whether an image is in focus or not. Focus detection is able to be used for improving camera autofocus performance. Focus detection by using only one feature does not provide enough reliability to distinguish in-focus and slightly out-of-focus images. A focus detection algorithm of combining multiple features used to evaluate sharpness is described herein. A large image data set with in-focus and out-of-focus images is used to develop the focus detector for separating the in-focus images from out-of-focus images. Many features such as iterative blur estimation, FFT linearity, edge percentage, wavelet energy ratio, improved wavelet energy ratio, Chebyshev moment ratio and chromatic aberration features are able to be used to evaluate sharpness and determine big blur images.