The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Oct. 28, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jason R. Baumgartner, Austin, TX (US);

Raj K. Gajavelly, Warangal, IN;

Ashutosh Misra, Lucknow, IN;

Pradeep K. Nalla, Bangalore, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5045 (2013.01);
Abstract

A method for performing redundancy identification in an integrated circuit design. An optimized gate in a logic circuit is identified. A first netlist with a representation of the logic circuit is generated. An error is induced on the optimized gate. A second netlist is generated from a copy of the first netlist incorporating changes based on the error. Fan-out boundaries of the logic circuit are propagated for the first and second netlists. A redundancy report representing optimization steps performed to obtain the original logic circuit is analyzed to identify which steps are adequate to cause unobservability of the optimized gate. This is done by representing the optimization steps as constraints over the first and second netlists. Responsive to the error becoming undetectable under the constraints derived from the redundancy report, a minimal set of reductions is identified from the first netlist as the reason for unobservability of the optimized gate.


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