The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Jun. 15, 2015
Applicants:

The United States of America As Represented BY the Secretary of the Army, Washington, DC (US);

Beam Engineering for Advanced Measurements Co., Orlando, FL (US);

Inventors:

Nelson V. Tabirian, Winter Park, FL (US);

Sarik R. Nersisyan, Maitland, FL (US);

Brian R. Kimball, Shrewsbury, MA (US);

Diane M. Steeves, Franklin, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); G02B 27/44 (2006.01); G02B 27/42 (2006.01);
U.S. Cl.
CPC ...
G02B 5/1828 (2013.01); G02B 5/1866 (2013.01); G02B 27/4272 (2013.01); G02B 27/44 (2013.01);
Abstract

Optical systems for controlling with propagation of light beams in lateral and angular space, and through optical apertures. The light beams include laser beams as well as beams with wide spectrum of wavelengths and large divergence angles. The optical systems are based on combination of diffractive waveplates with diffractive properties that can be controlled with the aid of external stimuli such as electrical fields, temperature, optical beams and mechanical means.


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