The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Jul. 08, 2014
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Gunnar Krueger, Ecublens, CH;

Davide Piccini, Prilly, CH;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01); G01R 33/567 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56509 (2013.01); G01R 33/5676 (2013.01); G01R 33/4826 (2013.01);
Abstract

A method and a magnetic resonance imaging apparatus provide subject/object motion detection and correction during a MRI scan. The method includes generating via a magnetic resonance scanner a magnetic field gradient and a radio-frequency signal for the MRI scan. The radio-frequency signal contains a successive repetition of pulse sequences, each pulse sequence starting with a radio-frequency excitation pulse. A time between two successive radio-frequency excitation pulses are defined as a repetition time. Detecting, from a readout signal emitted in response to the pulse sequence, time-points in which motion has occurred. Interleaves are automatically created. A sampling of the k-space is performed by arranging k-space MRI readout signals acquired over each repetition time of the pulse sequence into several groups of interleaves of uniform k-space sampling reconstructing separately each subset of interleaves for obtaining low resolution MR images.


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