The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Jul. 24, 2015
Applicant:

Nucleus Scientific, Inc., Cambridge, MA (US);

Inventors:

Ian W. Hunter, Lincoln, MA (US);

Grant W. Kristofek, Wayland, MA (US);

Dean Ljubicic, Somerville, MA (US);

Assignee:

Nucleus Scientific Inc., Cambridge, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01); G01R 31/01 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3675 (2013.01); G01R 31/016 (2013.01); G01R 31/3627 (2013.01); G01R 31/3641 (2013.01); G01R 1/06705 (2013.01); G01R 31/2886 (2013.01);
Abstract

A test instrument for use with a sample having a plurality of electrically conducting contact pads, the instrument including: a controllable, variable force linear actuator; a probe assembly operated by the linear actuator, the probe assembly having a probe head at one end with a surface for contacting the sample; a movable contactor assembly including a plurality of contacts for electrically contacting the plurality of contact pads on the sample; a housing on which the linear actuator and contactor assembly are mounted, the housing having an identified area for holding the sample during testing; a position sensor assembly for measuring changes in the position of the probe; and a sensor for measuring a force applied to the sample by the probe head.


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