The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Oct. 30, 2015
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

John A. Mossman, La Mesa, CA (US);

Robert A. McCarthy, Algonquin, IL (US);

Assignee:

Maxim Integrated Products, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H03F 1/52 (2006.01); H03F 3/45 (2006.01); H02J 1/00 (2006.01); H01H 1/00 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/02 (2013.01); H03F 1/52 (2013.01); H03F 3/45076 (2013.01); H01H 1/00 (2013.01); H01L 21/00 (2013.01); H02J 1/00 (2013.01);
Abstract

A method for detecting a fault condition of an operational amplifier of an integrated circuit during operation includes operating an integrated circuit which includes an operational amplifier (op-amp) having a V+ input, a V− input and an op-amp output and an on-line fault detector electrically coupled to the V+ input and the V− input of the op-amp of the on-line fault detector, monitoring an operation of the op-amp with the on-line fault detector, and developing a fault signal at a fault detector output if the op-amp is in a fault condition as determined by the on-line fault detector.


Find Patent Forward Citations

Loading…