The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Feb. 22, 2016
Applicant:

Nxgen Partners Ip, Llc, Dallas, TX (US);

Inventors:

Solyman Ashrafi, Plano, TX (US);

Roger Linquist, Dallas, TX (US);

Nima Ashrafi, Plano, TX (US);

Assignee:

NXGEN PARTNERS IP, LLC, Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/59 (2006.01); G01N 33/483 (2006.01); G01N 21/17 (2006.01); G01N 24/00 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/59 (2013.01); G01N 21/17 (2013.01); G01N 24/00 (2013.01); G01N 33/483 (2013.01); G01N 21/21 (2013.01);
Abstract

An apparatus that measures a concentration of a material within a sample includes signal generation circuitry that generates a first signal having at least one orthogonal function applied thereto and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and determines the concentration of the material within the sample based on a detected orthogonal function within the first signal received from the sample.


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