The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Nov. 18, 2014
Applicant:

Versalis S.p.a., San Donato Milanese, IT;

Inventors:

Francesco Bonacini, Mantova, IT;

Erik Mantovani, Revere, IT;

Angelo Ferrando, Sestri Levante, IT;

Assignee:

versalis S.p.A., San Donato Milanese, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08F 2/00 (2006.01); C08F 4/00 (2006.01); C08F 12/02 (2006.01); G01N 21/27 (2006.01); G01N 21/3577 (2014.01); G01N 21/359 (2014.01); G01N 21/85 (2006.01); C08F 112/08 (2006.01);
U.S. Cl.
CPC ...
G01N 21/272 (2013.01); C08F 112/08 (2013.01); G01N 21/359 (2013.01); G01N 21/3577 (2013.01); G01N 21/8507 (2013.01); G01N 2201/061 (2013.01); G01N 2201/0826 (2013.01); G01N 2201/13 (2013.01);
Abstract

The present invention relates to a method for monitoring a control parameter of a polymerization reaction mixture in heterogeneous phase comprising the following steps: (a) acquiring at least one NIR reflectance spectrum of said mixture; (b) calculating a value of said control parameter by means of a calibration curve which correlates the NIR reflectance spectrum with the values of said control parameter measured with a reference measurement method. The present invention also relates to an apparatus for implementing said method.


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