The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Jun. 20, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An information processing apparatus includes an irradiation unit to irradiate a measurement target with a measurement pattern for distance measurement. An imaging unit obtains a captured image including the irradiated measurement target. A first detection unit detects first and second regions from the captured image. The first region includes a first portion of the measurement target that reflects a greater amount of light toward the imaging unit. The second region includes a second portion of the measurement target that reflects a lesser amount of light toward the imaging unit. A second detection unit detects, from the measurement pattern, a first region with which the first portion is irradiated and a second region with which the second portion is irradiated. A generation unit generates a measurement pattern that has different amounts of irradiation light depending on regions. A distance to the measurement target is derived using an obtained captured image.