The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9714826 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 25, 2017

Filed:

Jun. 09, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tomoaki Higo, Tokyo, JP;

Toshihiro Kobayashi, Tokyo, JP;

Masayoshi Yamasaki, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/25 (2006.01); G06T 7/586 (2017.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G06T 7/586 (2017.01);
Abstract

A shape of an object is measured using a plurality of space encoding patterns each of which includes a light portion and a dark portion. A first and second pattern sets are obtained. The first set comprises patterns each of which has the light portion of each space encoding pattern masked by a pattern mask. The second set comprises patterns each of which has the light portion of each of the space encoding pattern masked by a mask with varying the mask pattern. Captured images of an object on which the patterns of the first and second sets are sequentially projected are inputted. A correspondence between projection coordinates of the projected pattern and image coordinates of a captured image for the projected pattern is detected. A shape of the object is derived based on correspondences.


Find Patent Forward Citations

Higo, Tomoaki. (2017). Measurement apparatus and method thereof (U.S. Patent No. 9714826). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9714826

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