The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Mar. 11, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventors:

Yosuke Horiuchi, Tokyo, JP;

Shinya Sakurada, Tokyo, JP;

Masaya Hagiwara, Kanagawa, JP;

Tsuyoshi Kobayashi, Kanagawa, JP;

Tadahiko Kobayashi, Kanagawa, JP;

Naoyuki Sanada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C22C 19/07 (2006.01); C22C 30/00 (2006.01); C22C 30/02 (2006.01); H01F 1/055 (2006.01); H02K 1/02 (2006.01);
U.S. Cl.
CPC ...
C22C 19/07 (2013.01); C22C 30/00 (2013.01); C22C 30/02 (2013.01); H01F 1/0557 (2013.01); H02K 1/02 (2013.01);
Abstract

The embodiments provide a high-performance permanent magnet. The permanent magnet includes a sintered body having a composition expressed by a composition formula RFeMCuCo, with carbon in a range from 50 mass ppm to 1500 mass ppm. The sintered body also includes a metallic structure. The metallic structure includes a main phase having a ThZncrystal phase, and a secondary phase having a carbide phase of the M element of the composition formula. A ratio (I/I) of a maximum intensity Iof a diffraction peak at an angle 2θ in a range from 37.5 degrees to 38.5 degrees to a maximum intensity Iof a diffraction peak at the angle 2θ in a range from 32.5 degrees to 33.5 degrees is greater than 25 but no greater than 80 in an X-ray diffraction pattern obtained by applying an X-ray diffraction measuring method to the sintered body.


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