The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Jun. 08, 2016
Applicant:

Boston Scientific Neuromodulation Corporation, Valencia, CA (US);

Inventors:

Robert Graham Lamont, Van Nuys, CA (US);

Damon Moazen, Northridge, CA (US);

Robert D. Ozawa, Woodland Hills, CA (US);

Thomas W. Stouffer, Chatsworth, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 1/36 (2006.01); A61N 1/378 (2006.01); A61N 1/372 (2006.01); A61N 1/37 (2006.01);
U.S. Cl.
CPC ...
A61N 1/36125 (2013.01); A61N 1/3706 (2013.01); A61N 1/378 (2013.01); A61N 1/37252 (2013.01); A61N 1/3782 (2013.01);
Abstract

An implantable medical device (IMD) is disclosed having measurement circuitry for measuring one or more currents in the IMD, such as the currents drawn from various power supply voltages. Such currents are measured without disrupting normal IMD operation, and can be telemetered from the IMD for review. Switching circuitry in line with the current being measured is temporarily opened for a time period to disconnect the power supply voltage from the circuitry being powered. A voltage across a capacitance in parallel with the circuitry is measured when the switching circuitry is opened and again closed at the end of the time period, with the circuitry drawing power from the charged capacitance during this time period. The average current drawn by the power supply voltage is determined using the difference in the measured voltages, the known capacitance, and the time period between the measurements.


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