The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Jan. 23, 2015
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Akira Ikeda, Nagano, JP;
Kazuhiro Nishida, Nagano, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); A61B 5/6816 (2013.01); A61B 5/6826 (2013.01);
Abstract
An optical rotation measurement method includes causing measurement light of a predetermined polarization to be incident on a subject from an incident direction that is a non-right angle to the subject, discriminating an optical rotation reflecting component of the predetermined polarization from reflected light that is reflected in a different direction to the incident direction of the subject, and measuring the optical rotation based on the discrimination result.