The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Aug. 07, 2015
Applicant:

President and Fellows of Harvard College, Cambridge, MA (US);

Inventors:

Xiaowei Zhuang, Lexington, MA (US);

Bo Huang, San Francisco, CA (US);

Wilfred M. Bates, Gottingen, DE;

Wenqin Wang, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/28 (2006.01); H04N 13/02 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G02B 27/58 (2006.01); H04N 7/18 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0203 (2013.01); G01N 21/64 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01); H04N 7/18 (2013.01); G01N 2021/6419 (2013.01); G01N 2021/6421 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6441 (2013.01);
Abstract

The present invention generally relates to sub-diffraction limit image resolution and other imaging techniques, including imaging in three dimensions. In one aspect, the invention is directed to determining and/or imaging light from two or more entities separated by a distance less than the diffraction limit of the incident light. For example, the entities may be separated by a distance of less than about 1000 nm, or less than about 300 nm for visible light. In some cases, the position of the entities can be determined in all three spatial dimensions (i.e., in the x, y, and z directions), and in certain cases, the positions in all three dimensions can be determined to an accuracy of less than about 1000 nm. In one set of embodiments, the entities may be selectively activatable, i.e., one entity can be activated to produce light, without activating other entities. A first entity may be activated and determined (e.g., by determining light emitted by the entity), then a second entity may be activated and determined. The emitted light may be used to determine the x and y positions of the first and second entities, for example, by determining the positions of the images of these entities, and in some cases, with sub-diffraction limit resolution. In some cases, the z positions may be determined using one of a variety of techniques that uses intensity information or focal information (e.g., a lack of focus) to determine the z position. Non-limiting examples of such techniques include astigmatism imaging, off-focus imaging, or multi-focal-plane imaging. Other aspects of the invention relate to systems for sub-diffraction limit image resolution, computer programs and techniques for sub-diffraction limit image resolution, methods for promoting sub-diffraction limit image resolution, and the like.


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Zhuang, Xiaowei. (2017). Sub-diffraction limit image resolution in three dimensions (U.S. Patent No. 9712805). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9712805

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